Date of Award

5-2013

Document Type

Thesis

Degree Name

Master of Science (MS)

Department

Physics

First Advisor

Devki N. Talwar, Ph.D.

Second Advisor

V. Wijekumar, Ph.D.

Third Advisor

Muhammad Numan, Ph.D.

Abstract

With the continuous development of new optical materials using various experimental methods the need to find a way to characterize what a particular material is cost effectively becomes eminent. The most effective way to truncate cost is to have the ability to characterize materials nondestructively. For the manufacturing requirement of semiconductor materials there needs to be significant agreement to characterize the samples. For this to be fulfilled theoretical representations must be developed and utilized in combination with concise experimental data. The reflectance data for the above mentioned FTIR measurements can be rendered using effective medium theory approximations In this thesis we will present the necessary background and utilize effective medium approximations to match experimental data. This work will also include several other theoretical tools to model reflectance data which include and is not limited to: interface roughness

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